Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a major ...
In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...
This commemorative gathering is also part of the global NANOscientific Symposium Series, which promotes open scientific exchange in AFM and nanoscale metrology across multiple regions worldwide.
From the inception of the groundbreaking nGauge AFM to the launch of the innovative Redux AFM, David Morris, Director of Operations, shares insights on ICSPI's mission to enhance accessibility and ...
insights from industryDr. Thomas MuellerDirector of Product ManagementBruker Nano Surfaces An interview with Dr. Thomas Mueller, Director of Product Management at Bruker Nano Surfaces conducted by ...
Technology advances have steadily been implemented to improve the performance of commercial atomic force microscopes (AFMs) since the release of the first commercial model about 30 years ago. Now, the ...
SAN JOSE, Calif. — Chip-equipment provider Veeco Instruments Inc. (Woodbury, N.Y.) has signed a joint development program in the atomic force microscopy (AFM) market with France's CEA Leti and ...
An interview with Prof. David Alsteens, Université Catholique de Louvain conducted by April Cashin-Garbutt, MA (Cantab). Can you please give a brief introduction to your research using AFM to image ...
SANTA CLARA, Calif., April 21, 2021 /PRNewswire/ -- Park Systems, world leading manufacturer of Atomic Force Microscopes announced the company stock valuation exceeded 1 Trillion KRW (almost $1 ...
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