Semiconductor Engineering

Improve Logic Test With A Hybrid ATPG/BIST Solution

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
Electronic Design

Combining Logic BIST and Scan Test Compression

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...
Electronic Design

What’s The Difference Between ATPG And Logic BIST?

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...
Yahoo

A Mathematician Says Most People Can't Solve This "3 Hats" Logic Test

This logic test about a cat in a hat stumps most people— but will it confuse you? According economics and math pro Presh Talwalkar of the YouTube channel Mind Your Decisions, a survey found only 36 ...
Hindustan Times

Logic test: Solve this tricky maths riddle to earn the title of brain teaser champion

Brain teasers are more than just fun distractions — they challenge logical reasoning, pattern recognition, and creative thinking. From school students to working professionals, many enjoy these ...